Effective repair technology for faulty semiconductor memory cells Professor Kang Seong-ho of Electrical and Electronic Engineering has won the Science Engineer of the Month Award. As an award granted by the Ministry of Education, Science, and Technology and the National Research Foundation of Korea, the Science Engineer of the Month Award in April was presented to Professor Kang in recognition of his achievements in devising a circuit that detects breakdowns and autonomously repairs them. Professor Kang’s built-in arithmetic circuit effectively repairs faulty memory cells detected in the memory test. Professor Kang Seong-ho has attained a number of outstanding accomplishments in the field of Korean Semiconductor Test, including the Test Association founded in 2002 and the Korean Semiconductor Test Society in 2008. He is leading globally competitive studies in the field of Design for Testability, while his findings continue to be published in influential international journals such as IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems and IEEE Transactions on Very Large Scale Integration Systems.